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JTAG Test Development
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JTAG External Modules (JEM_DIMM/SODIMM) for the DDR2/DDR3 Memory Socket Test
JTAG External Modules for Cluster Test
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Test News Worldwide
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Test News Worldwide
Recommended Web Links:
JTAG.TECT (Russian web site) ×
http://www.jtag-test.ru
IEEE 1500 Embedded Core Test ×
http://grouper.ieee.org/groups/1500/
IEEE Design & Test ×
http://www.computer.org/portal/site/design
Scanseer ×
http://www.scanseer.com/?gclid=CK-WkOyCyo4CFQxWZwodIGevAQ
JTAG Toolkit ×
http://www.jtag.tk
Asset InterTech ×
http://www.asset-intertech.com/products/free_resources.htm
Asset BSDL Validation ×
http://www.asset-intertech.com/bsdl_service
Corelis ×
http://www.corelis.com
Goepel Electronic ×
http://www.goepel.com/content/html_en/index.php?site=bs_tutorial&level1=scan&level2=bs_tutorial&level3
JTAG Technologies ×
http://www.jtag.com/main.php?cm=p8_1___2
Flynn Systems ×
http://www.flynn.com/products/ontap.php?PHPSESSID=ab53a7b4f3e5480e513248ffba482c2c
Bennetts Associates ×
http://www.dft.co.uk/other-links.html
ATE World ×
http://www.ateworld.com/home_pages/news_release_archive.cfm
Acculogic ×
http://www.acculogic.com
Intellitech ×
http://www.intellitech.com
XJTAG ×
http://www.xjtag.com/jtag.php
DirectInsight ×
http://www.directinsight.co.uk/function/boundary-scan-jtag.html
ElectronicsTalk ×
http://www.electronicstalk.com/guides/jtag.html
MentorGraphics ×
http://www.mentor.com/
IEEE 1149.4 Working Group ×
http://grouper.ieee.org/groups/1149/4/
Teradyne ×
http://www.teradyne.com/atd
National Seconductor ×
http://www.national.com/appinfo/scan
Altera ×
http://www.altera.com/literature/an/an039.pdf
Our glance on the Test News Worldwide
You can found here links on the most interesting things, news and events
in the world of the Structural Test Industry: ICT, JTAG, DFT, and others.
Your
outlook
about this is very appreciated!
Expanded Role for JTAG DFT
Relationships key to boundary-scan success
Corelis Adds Capability to Directly Program Serial Bus I2C and SPI-based Devices
Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Boards Test
Design-For-Testability Blog
The DFT Blog
Reuben SchriftÓ³ paper on ICT in RoHS environment
Boundary-scan tools extend beyond basic PCB testing
Testability Management Action Group (TMAG)
New IEEE 1149.7 Test & Debug Standard Expands and Improves JTAG Functionality
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Test News Worldwide
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