StarTest serves as the ICT/JTAG test support supplier
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StarTest is founded in January 2003 and is now a leading developer and supplier of the test solutions in Israel on any hardware level, including device, board, and system. StarTest is a dedicated team of test experts and engineers with the summary experience of more than 70 years worldwide.

StarTest serves as the ICT/JTAG test support supplier in the following fields:

  • The Design-For-Testability (DFT) analysis of electronic circuits before layout and in all stages of their lifetime including the check-up of the customer’s design DFT compliance, as well as multi-chain and system level (via backplane) JTAG implementation support.
  • The optimal test strategy selection — whether ICT, JTAG, or both methods together — for the higher test coverage and shorter time-to-market. The test coverage maximization for the mixed JTAG/ICT usage.
  • The ICT program development for the Teradyne Z18xx testers, the test process support on the customer production facility (Flextronics, A.L.Electronics, PCB Technologies, Zicon, SCI Sanmina, etc).
  • The JTAG (Boundary-Scan) test program development, including the on-board programming of CPLD, FPGA, FLASH, I2C, etc., for all the tools of the following vendors:
    • ScanPlus and ScanExpress of Corelis;
    • onTAP of Flynn Systems;
    • ProVision of JTAG Technologies;
    • ScanWorks of Asset InterTech;
    • XJRunner of XJTAG.
  • Development, production and shipment worldwide a wide range of hardware and software test products:
  • The full JTAG test process support (installation, test debug and running, failure diagnostics, maintenance, User Guide preparation) performed in the customer’s production facility, as well as in the customer’s laboratory/test facility on-demand.
  • The Boundary-Scan technology and Design-For-Testability (DFT) courses, as well as seminars and training on the customer facility. Help customers with the newest Boundary-Scan standards usage, such as IEEE 1149.4, IEEE 1149.6, IEEE 1149.7, IEEE P1149.8.1, IEEE 1532, IEEE 1500, In-System Configuration IEEE 1532, IJTAG (IEEE P1687).
  • The Design-For-Testability (DFT) Manuals development for private customer usage.
  • The JTAG (Boundary-Scan) vendor benchmarking (features comparison) and the selection consulting for the customer needs.

We're working with a plenty of companies, our customers range from start-ups to billion dollar companies, and they are located in the following countries:


Israel
USA
Canada
Russia
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StarTest News

10th EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS 2012)
Kharkov, Ukraine, September 14-17, 2012
EWDTS 2012
Some pictures and testimonies of our involvement in the Test & Measurement Running Show (October 26, 2010, Herzlia, Israel) are accessible here.

Dr. JTAG Monthly Focus

29.01.2012
We are pleased to introduce right now the completely new DDR3 Unbuffered DIMM test module that is intended for the DDR3 SDRAM test such as MT18JSF25672AZ — 2GB, MT18JSF51272AZ — 4GB
Flynn Systems debuts HW cluster tools
Flynn Systems has augmented its hardware line with the introduction of the StarTest JEM_DIMM/SODIMM modules family.


  
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