Russian Hebrew
Skip Navigation Links
About UsExpand About Us
SolutionsExpand Solutions
ProductsExpand Products
StarTest UniversityExpand StarTest University
Partners and Customers
Contact Us

StarTest Ltd. is founded in January 2003 and now is a leading developer and supplier of the test solutions in Israel on any hardware level, including device, board, and system. StarTest is the team of test experts and engineers with the summary experience of more than 70 years worldwide.

StarTest serves as the ICT/JTAG test support supplier in the following fields:

  • The Design-For-Testability (DFT) analysis of electronic circuits before layout and in all stages of their lifetime including the check-up of the customer’s design DFT compliance, as well as multi-chain and system level (via backplane) JTAG implementation support.
  • The optimal test strategy selection – whether ICT, JTAG, or both methods together - for the higher test coverage and shorter time-to-market. The test coverage maximization for the mixed JTAG/ICT usage.
  • The ICT program development for the Teradyne Z18xx testers, the test process support on the customer production facility (Flextronics, Teliran, Zicon, SCI Sanmina, etc).
  • The JTAG (Boundary-Scan) test program development, including the on-board programming of CPLD, FPGA, FLASH, I2C, etc., for all the tools of the following vendors:
    • ScanPlus and ScanExpress of Corelis
    • onTAP of Flynn
    • ProVision of JTAG Technologies
    • ScanWorks of Asset InterTech
    • CASCON of Goepel
  • The full JTAG test process support (installation, test debug and running, failure diagnostics, maintenance, User Guide preparation) performed in the customer’s production facility, as well as in the customer’s laboratory/test facility on-demand.
  • The Boundary-Scan technology and Design-For-Testability (DFT) courses, as well as seminars and training on the customer facility. Help customers with the newest Boundary-Scan standards usage, such as IEEE 1149.4, IEEE 1149.6, IEEE 1532, IEEE 1500, In-System Configuration IEEE1532, IJTAG (IEEE P1687).
  • The Design-For-Testability (DFT) Manuals development for private customer usage.
  • The JTAG (Boundary-Scan) vendor benchmarking (features comparison) and the selection consulting for the customer needs.