Some Success Stories & Testimonies
Test & Measurement Running Show, October 26. 2010 | Daniel Hotel, Herzlia, Israel
Lecture of Dr. Ami Gorodetsky ̎ew JTAG Test and Debug Standard IEEE 1149.7ۍ
עמי
בוקר טוב!
שמחתי מאוד
שהזמנו אותך
להרצות בכנס
שמחתי
מאוד שהזמנו
אותך להרצות בכנס
שנערך
ב- 26.10.2010 במלון
דניאל,
הרצליה.
ההדים
על הרצאתך לא
מפסיקים
להגיע ואני
שומעת רק
ביקורות
טובות.
החומר
שהכנת היה
מקיף והוסבר
מצוין על ידך.
הרצאתך
הייתה
מעניינת,
מלווה
בדוגמאות
והמחשות.
אין
לי ספק שכל
המשתתפים
יצאו מרוצים
לאור יכולתך
וגם עם מספר ´טיפים´
חשובים.
תודה
מקרב לב !
אני
אשמח להיות
איתך בקשר
בעתיד.
Yael Koffer Rokban
Head of Exhibition Department
TEST SUCCESS STORY OF THE FLEXTRONICS PLANT
When printed circuit board contract manufacturer Flextronics Israel ran into a high
failure rate on a densely populated boards, Michael Dolkin, NPI Manager of Flextronics Israel, wasn't sure what he could do to solve
the problem.
"We don't have JTAG software capability on our staff here," Mr. Dolkin said. "So
we turned to StarTest to help us and they developed a test program for us
that have been very successful."
The board in question was densely populated with fine-pitch integrated circuits
(ICs) and ball grid arrays (BGAs). Physical access to test points and to many of
the devices themselves was nonexistent. As a result, SMT's in-circuit test (ICT)
equipment could not be used to locate and diagnose the problems that were causing
the high failure rate.
"We use ICT equipment extensively in the tight cooperation with StarTest,
but for some boards, we just don't have the access that an ICT system needs," Mr.
Dolkin explained. "That's when we turn to JTAG. We use ICT and JTAG as complements
to each other and that has worked very well for us. With more and more ICs having
JTAG cells and the increasing density of board designs, we are turning to JTAG more
often. And whenever we use JTAG, we turn to StarTest."
The JTAG test program developed and implemented by StarTest personnel using
the Corelis and JTAG Tech Boundary-Scan test and in-system programming systems was
able to locate many of the opens and shorts that were causing problems on the assembled
boards. And when the test program could not pinpoint the exact failure, the test
programs debug capability was used to troubleshoot the board until the problem was
fixed.
"We don't necessarily want to develop in-house JTAG expertise, but every time we
need help on a project, StarTest has come through for us. They have been
very responsive and worked very hard to assure our success," Mr. Dolkin concluded.
Alvarion® סיפור
ההצלחה של
"מדיניות
לביצוע
בדיקות
מבניות ב-Alvarion
במשך שנים היא
שילוב של
בדיקות ICT עם
בדיקות Boundary-Scan"
אמר מוטי
עזרא, מנהל
בדיקות Alvarion.
"הדרישות
שלנו לאיכות בדיקה
וכיסוי תקלות
הן מאוד
גבוהות, וזוהי
הסיבה
שחיפשנו קבלן
משנה לעבודות
האלו יסודי במיוחד,
ובחרנו StarTest.
אנחנו עובדים
מספר שנים
בצמוד עם חברה
זו כקבלן משנה
לפיתוח
תכניות בדיקה,
גם ב-ICT וגם ב-Boundary-Scan. זוהי
קבוצת מומחים
בעלי הבנה
עמוקה בכלי
פיתוח תכניות
בדיקה, אנליזת
תקלות
וגילויין.
אנו ב-Alvarion
מרוצים מאוד
מהאיכות
שירות בדיקות
שאנו מקבלים
מחברת StarTest
ובכוונתנו
להמשיך שיתוף
פעולה
פורח זו".
Testing prototype boards before the designs are even functional reduce development
cost
at PMC-Sierra with using the StarTest JTAG test service
PMC-Sierra is a leading provider of broadband
communications and storage semiconductors for metro, access, fiber to the home,
wireless infrastructure, storage, laser printers, and fiber access gateway equipment.
Gadi Rachmani is a PMC-Sierra (Israel) Operation Manager, responsible for
the boards manufacture. Gadi came to StarTest looking for a more effective
method for bringing up complex prototype assemblies. The diminishing access of test
points on these complex board assemblies, due to fine pitch components and restrictive
packaging types such as BGA, often prevented the usage of traditional probing methods
and was making board bring-up a costly and time consuming process.
Design engineers are often faced with a confounding problem when bringing up new
prototype assemblies. Detecting a manufacturing defect before a design has been
verified as functional can be a frustrating task. When this problem is multiplied
by the inability to access crucial test points then the initial debug process can
become a huge bottleneck that slips the entire development schedule. Aware of these
potential pitfalls, Gadi was seeking for a more effective solution to help
streamline this initial debug process.
Using the StarTest JTAG test service, PMC-Sierra (Israel) was able to create
test vectors and have a test plan in place prior to receiving their first prototype
boards from assembly. When the boards arrived, they connected the StarTest
JTAG test equipment to their prototype boards. Before their embedded processor fetched
its first opcode, they were able to execute a complete board level interconnect
test, test on-board memory devices, program CPLDs and Flash memory devices, and
test system logic clusters.
"The StarTest JTAG test service has been extremely helpful in getting our
boards up and running. We've been able to identify manufacturing defects and have
them repaired prior to trying to make the board functional. I'm sure this has saved
countless troubleshooting hours. We are very pleased with the StarTest test
service level and their readiness to help us immediately", said Gadi.