StarTest™ serves as the ICT/JTAG test support supplier


JTAG TAP Extender module designed for using with single or double TAP controllers and allows to extend single primary TAP connection to up to 4 serially connected JTAG chains.
JTAG TAP Extender module has the following properties:
  • Buffering TCK & TMS signals for each secondary TAP. TCK freq. range up to 100 MHz.
  • Using External PS (5V - 12V) or internal (3.0V - 3.6V) (VCC1, VCC2) voltage, jumper selected from one of secondary TAPs for powering.
  • Each secondary TAP bypassed by default and becomes active if the chain cable inserted.
  • Two external voltages per secondary TAP available for measurement via primary TAP by selection with two IO lines from primary TAP.
  • Six additional IO lines available to each secondary TAP from the primary TAP.
  • Available in plastic box for external connections or without it for into fixture integration.

JTAG TAP Distributor Tool (TAP-Di)

The TAP Distributor TAP-Di is intended for the on-the-fly reconfiguration of the in-circuit JTAG chains during the test sequence execution or before the test starting. The TAP-Di is accessible in the following configurations and all possible sub-configurations:

  • TAP-Di.4 (one primary TAP fanned-out to 4 secondary TAPs);
  • TAP-Di.8 (one primary TAP fanned-out to 8 secondary TAPs);
  • TAP-Di.16 (one primary TAP fanned-out to 16 secondary TAPs).

The TAP Distributor TAP-Di allows any sequence and any number (up to 16) of the secondary TAPs (STAPs) or JTAG chains. The TAP-Di tool automatically recognizes the installed STAPs and allows user automatically build the reconfigured test sequences for secondary JTAG chains with any combination of a STAP voltages (3.3V, 2.5V, 1.8V, 1.5V). For example, if there are four user's secondary JTAG chains: Ib (3V3), Ic (2V5), Id (1V8), and Ie (1V5), the primary TAP might be connected to any of the following JTAG chain combinations and sequences:
  • Ib (3V3) + Ic (2V5) + Id (1V8) + Ie;
  • Ic (2V5) + Ie (1V5) + Id (1V8);
  • Id (1V8) + Ie (1V5);
  • Ie (1V5) + Id (1V8) + Ic (2V5);
  • etc.

The TAP-Di tool provides the gang (concurrent) mode for several identical JTAG chains testing. The expected signature (CRC or LFSR) of any TDO signal is calculating using the special CRC algorithm and comparing with the Known-Good-Board value. There is no multi-drop architecture used in the TAP-Di tool! Each circuit board or assembly with the JTAG header (or without it נvia our JEMIO tool נsee Fig. 4 and here) is capable to be connected to one of the TAP-Di secondary ports.


Fig. 1. TAP-Di Common Diagram

TAP-Di Common and Gang Test Modes

Fig. 2. TAP-Di Common and Gang Test Modes

TAP-Di Gang Flash Mode for JTAG-based boards

Fig. 3. TAP-Di Gang Flash Mode for JTAG-based boards

TAP-Di Gang Flash Mode for non-JTAG boards

Fig. 4. TAP-Di Gang Flash Mode for non-JTAG boards

The special TAP-Di gang mode (Gang-F) is intended for the simultaneous burn-in of a number of similar Flash devices connected to a number of the STAP ports. Such burn-in setup significantly increases the Flash programming throughput in the board mass production. For example, if the burn-in time of a Flash device on a board is N sec and you are going to burn-in a batch of K boards, with connection of all K boards to the TAP-Di in the Gang-F mode the total burn-in elapsed time have to be N/K instead of N*K!

In addition to single device and gang Flash programming, both for boards with the JTAG support (Fig. 3), and for non-JTAG boards (Fig. 4), the TAP-Di tool has a range of options to test and program an array (eight pairs) of in-circuit serial buses, including SMBus, SPI, I2C, and MicroWire (Fig. 1).

The remarkable feature of the TAP-Di tool are four (4) in-circuit DC voltage measurement inputs (Fig. 1). This analog JTAG measurement option is intended for the in-circuit DC voltage verification and monitoring with JTAG tools of any vendor.

The TAP-Di tool is also equipped with 32 external JTAG-controllable outputs (Fig. 1) that are intended for any in-circuit JTAG constraints or/and setup support.

The TAP-Di tool can be used by test and production engineers to broaden the scope of their in-system device programming facilities without adding much, if any, additional hardware. The TAP-Di tool enables manufacturers of PCBs employing multivendor JTAG test programs for test, in-system programming and Flash burning.

The Burn-in Header is the regular 10-pin male header with the standard Altera pin-out.

The Master Header is the regular 20-pin male header that in addition to the regular five JTAG pins is equipped with the following 3 additional pins: CONFIG, /WE, RDY/BSY.

The CONFIG pin of the Master header is dedicated to switch the TAP-Di internal circuitry between two functional modes:
  • Chain Configuration (CC) mode: CONFIG is asserted;
  • Test mode (CONFIG is de-asserted, High level by default).

Each Secondary TAP Header is the regular 20-pin male header that in addition to the regular five JTAG pins is equipped with the following 3 additional pins: PRESENCE, /WE, RDY/BSY.

The PRESENCE pin of each STAP header is dedicated to interrogate that the corresponding JTAG chain is actually connected to the STAP header.

The TAP-Di tool key benefits are the following:
  • Provides high JTAG fan-out for any printed circuit board;
  • Enables JTAG programmable access to any circuit board in a system from a single-TAP interface;
  • Enables simplified in-the-field updates and upgrades by providing a structured access to both volatile and non-volatile ICs in a system (enables programming FPGAs, flash, EEPROM, etc.);
  • Enables simultaneous (gang) test and on-board programming on each similar circuit board in a system without the added cost of having on-board PROMs or BIST in each circuit board;
  • Enables in-circuit DC voltage measurement and monitoring through JTAG channels;
  • Enables simplified PCB-to-PCB interconnect testing.

The TAP Distributor TAP-Di is fully compatible with the following JTAG vendor ATPG and Runner platforms:

  •   Flynn Systems' onTAP Series 4000
  •   Corelis' ScanExpress
  •   JTAG Technologies' ProVision
  •   Asset' ScanWorks
  •   Goepel' CASCON
  •   XJTAG' XJRunner

Site map | About Us | Solutions | Products | StarTest™ Library | Partners and Customers | Support | Monograph
Contact Webmaster
© StarTest™.
All rights reserved