StarTest™ serves as the ICT/JTAG test support supplier
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JTAG Test Development

StarTest™ offers a wide range of the JTAG test development services so that a customer can maintain a high level of cost efficiency by selecting the appropriate JTAG test platform needed for each design. We support the following JTAG (Boundary-Scan) test platforms, including the On-board Programming of CPLD, FPGA, FLASH, I2C, etc.:

 
  • ScanPlus and ScanExpress of Corelis;
  • onTAP of Flynn Systems;
  • ProVision of JTAG Technologies;
  • ScanWorks of Asset InterTech;
  • XJDeveloper & XJRunner of XJTAG.

StarTest™ supports the customer with services beginning on the early design stages and continuing through assembly and manufacturing. The customer achieves a high return on its investment in JTAG tests and programming routines because StarTest™ ensures a maximum level of test support throughout the development and manufacturing processes.

We have expertise with the following Boundary-Scan (JTAG) standards:

 
  • JTAG/IEEE 1149.1          Boundary-Scan (digital)
  • IEEE 1149.4                   Mixed Signal Boundary-Scan (analog)
  • IEEE 1149.6                   LVDS and Advanced Boundary-Scan
  • IEEE 1149.7                   Compact JTAG
  • IEEE 1149.8.1                JTAG-Based Stimulus of Interconnects to Passive and/or Active Components
  • IEEE 1500 SOC              SOC Embedded Core Test

Some of our JTAG test development services are as following:

 
  • Board-level interconnection test, incl. buswire and pull-up/pull-down test
  • Memory cluster test (SSRAM, SDRAM, DDR SDRAM, DDR2 SDRAM, DDR3 SDRAM, I2C, EEPROM, etc.)
  • Multi-board and simultaneous test
  • CPLD / FPGA on-board programming, Flash programming of all types and all technologies (NOR, NAND, PCM)
  • Cluster test for non-JTAG and analog schematics parts
  • Field and production facility service

JTAG Test Coverage Details on Different JTAG Vendor Platforms: Corelis Platform JTAG Test Coverage Details.




 
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