JTAG Test Development

StarTest™ offers a wide range of the JTAG test development services so that a customer can maintain a high level of cost efficiency by selecting the appropriate JTAG test platform needed for each design. We support the following JTAG (Boundary-Scan) test platforms, including the On-board Programming of CPLD, FPGA, FLASH, I2C, etc.:

ScanPlus and ScanExpress of Corelis;
onTAP of Flynn Systems;
ProVision of JTAG Technologies;
ScanWorks of Asset InterTech;
XJDeveloper & XJRunner of XJTAG.

StarTest™ supports the customer with services beginning on the early design stages and continuing through assembly and manufacturing. The customer achieves a high return on its investment in JTAG tests and programming routines because StarTest™ ensures a maximum level of test support throughout the development and manufacturing processes.

We have expertise with the following Boundary-Scan (JTAG) standards:

JTAG/IEEE 1149.1 Boundary-Scan (digital)
IEEE 1149.4 Mixed Signal Boundary-Scan (analog)
IEEE 1149.6 LVDS and Advanced Boundary-Scan
IEEE 1149.7 Compact JTAG
IEEE 1149.8.1 JTAG-Based Stimulus of Interconnects to Passive and/or Active Components
IEEE 1500 SOC SOC Embedded Core Test

Some of our JTAG test development services are as following:

Board-level interconnection test, incl. buswire and pull-up/pull-down test
Memory cluster test (SSRAM, SDRAM, DDR SDRAM, DDR2 SDRAM, DDR3 SDRAM, I2C, EEPROM, etc.)
Multi-board and simultaneous test
CPLD / FPGA on-board programming, Flash programming of all types and all technologies (NOR, NAND, PCM)
Cluster test for non-JTAG and analog schematics parts
Field and production facility service

JTAG Test Coverage Details on Different JTAG Vendor Platforms: Corelis Platform JTAG Test Coverage Details.

    · JTAG Test Development
    · ICT Test Development
    · Design-For-Testability
    · BSDL Silicon Validation
    · Regulatory Consulting

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