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JTAG External Modules (JEM_DIMM/SODIMM) for the DDR2/DDR3 Memory Socket Test

Modules JEM_SODIMM200 and JEM_SODIMM200_SOM

Modules JEM_SODIMM200 and JEM_SODIMM200_SOM

Module JEM_SORDIMM200

Module JEM_SORDIMM200

Module JEM_DIMM240

Module JEM_DIMM240

Module JEM_DIMM184

Module JEM_DIMM184

Module JEM_UDIMM240-DDR3

Module JEM_UDIMM240-DDR3

Check for availability. This is moving fast

Popular devices include MT18JSF25672AZ 2GB and MT18JSF51272AZ 4GB

    

The primary function of the JTAG External Modules (JEM) for the DIMM/SODIMM Socket Cluster Test is to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system and to strengthen the memory-independent JTAG testing for the assembly correctness of the almost full spectrum of the modern socket types, particularly (according to JEDEC_Std.21-C):


  • DIMM (Dual In-line Memory Module), miniDIMM, microDIMM, VLP DIMM sockets;
  • SODIMM (Small Outline Dual In-line Memory Module) sockets;
  • SORDIMM (Small Outline Registered Dual In-line Memory Module) sockets;
  • SOCDIMM (Small Outline Clocked Dual In-line Memory Module) sockets;
  • VLP SORDIMM (Very Low Profile Small Outline Registered Dual In-line Memory Module) sockets;
  • FBDIMM (Fully Buffered Dual In-line Memory Module) sockets;
  • UDIMM (DDR3 Unbuffered DIMM) sockets;
  • CompactFlash Module sockets with form factor upon demand;
  • etc.

For many designs, JTAG test has adequate access to on-board signals, but signals that go off the board often cannot be tested. By adding JTAG access to memory socket off-board signals, a JEM_DIMM/SODIMM module can increase the board's fault coverage, possibly reducing the need for developing alternative tests to reach the required test coverage level. The JEM_DIMM/SODIMM module provides a number of JTAG accessible individually controlled test channels that can be used to control and observe signals that go off the board.


The JEM_SODIMM200_SOM modules are specifically intended for usage with the Variscite SoM sockets in order to enhance the testability (DFT) of the motherboards the Variscite SoM modules are working with these sockets.


The JEM_DIMM/SODIMM module provides full bi-directional JTAG controllability and observability for all socket pins and is fully compatible with the following JTAG ATPG platforms:


  •   Flynn Systems onTAP Series 4000
  •     
  •   Corelis ScanExpress
  •       
  •   JTAG Technologies ProVision
  •     
  •   Asset ScanWorks
  •     
  •   Goepel' CASCON
  •     
  •   XJTAG' XJRunner
  •     

The ATPG tools of each of these JTAG test platforms can generate tests with the advanced diagnostics for the socket pins failure detection, as well as sensing analog voltages on the individual power pins (such as Vdd, Vddq, Vddspd and Vref). The JEM_DIMM/SODIMM module TAP channel can be simply combined with any board TAP chain or used as a separate TAP. An advantage over other similar solutions is that the JEM_DIMM/SODIMM module connection setup can be done either with an external TAP cable or completely in-circuit, without any cabling! The modules design is ready for cascading multiple DDR2/DDR3 memory socket testing. Each JEM_DIMM/SODIMM module features hot-swap capability.

Our JEM_DIMM/SODIMM module product line consists of almost full spectrum of the modern socket types, more than 20 types right now, each additional DDR2/DDR3 memory socket type is also accessible upon request.

JEM with external TAP cable

JEM with external TAP cable

 
JEM without external TAP cable (completely in-circuit)

JEM without external TAP cable (completely in-circuit)

SORDIMM Socket on PCB

SORDIMM Socket on PCB

It's worthwhile to emphasize that the usage of any DIMM socket test modules of our competitors needs a customer have a merger software, because these DIMM modules are described by the netlist. In the contrary, we're giving the DIMM socket BSDL file instead, so there is no need to modify the BUT netlist.





 
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