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JTAG.TECT is our subsidiary for Russian-speaker customers   מבוא בעברית
 

Conferences and Exhibitions we are involved


ProduTech Conference & Exhibition, June 10. 2010 | Dan Panorama Hotel, Tel Aviv, Israel.
Lecture of Dr. Ami Gorodetsky "New JTAG Test and Debug Standard IEEE 1149.7"

  

Embedded Systems Conference, July 6. 2010 | Avenue Convention Center, Airport City, Israel.
Lecture of Dr. Ami Gorodetsky "Embedded JTAG IEEE P1687 - A Step Toward a DFT Standard"

   Test & Measurement Running Show

Test & Measurement Running Show, October 26. 2010 | Daniel Hotel, Herzlia, Israel.
Lecture of Dr. Ami Gorodetsky "New JTAG Test and Debug Standard IEEE 1149.7"

New-Tech International Exhibition, March 15-16. 2011 | Exhibition Fairs, Tel Aviv, Israel.
Lecture of Dr. Ami Gorodetsky "New JTAG Test Standard IEEE 1687: a Step Toward a DFT Standard"





 
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